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Analysis and modelling of Temperature Effect on DIBL in UTBB FD SOI MOSFETs

Bibliographic reference Pereira, Arianne Soares do Nascimento ; de Streel, Guerric ; Planes, N. ; Haond, M. ; Giacomini, R. ; et. al. Analysis and modelling of Temperature Effect on DIBL in UTBB FD SOI MOSFETs.2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016) (Vienne (Austria), du 25/01/2016 au 27/01/2016). In: Proceedings de la conférence EUROSOI-ULIS 2016, IEEE2016, p.116-119
Permanent URL http://hdl.handle.net/2078.1/173664