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RF SOI CMOS Technology on 1st and 2nd Generation Trap-Rich High Resistivity SOI Wafers

Bibliographic reference Kazemi Esfeh, Babak ; Kilchytska, Valeriya ; Flandre, Denis ; Raskin, Jean-Pierre. RF SOI CMOS Technology on 1st and 2nd Generation Trap-Rich High Resistivity SOI Wafers.2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2016) (Vienne (Austria), du 25/01/2016 au 27/01/2016). In: Proceedings de la conférence EUROSOI-ULIS 2016, IEEE2016, p.159-161
Permanent URL http://hdl.handle.net/2078.1/173584