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Study of the irradiation creep based on nanomechanical lab-on-chip testing

Bibliographic reference Lapouge, Pierre ; Onimus, Fabien ; Bréchet, Yves ; Pardoen, Thomas ; Raskin, Jean-Pierre ; et. al. Study of the irradiation creep based on nanomechanical lab-on-chip testing.ICM12 - 12th International Conference on the Mechanical Behavior of Materials (Karlsruhe, Allemagne, du 10/05/2015 au 14/05/2015). In: Book of abstracts, 2015
Permanent URL http://hdl.handle.net/2078.1/173220