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A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects

Bibliographic reference Pardoen, Thomas ; Colla, Marie-Stéphane ; Idrissi, Hosni ; Amin-Ahmadi, Behnam ; Wang, Binjie ; et. al. A versatile lab-on-chip test platform to characterize elementary deformation mechanisms and electromechanical couplings in nanoscopic objects. In: Comptes rendus. Physique, Vol. 17, no.3-4, p. 485-495 (2016)
Permanent URL http://hdl.handle.net/2078.1/170012