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Assessment of 28nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements

Bibliographic reference Kazemi Esfeh, Babak ; Kilchytska, Valeriya ; Barral, V. ; Planes, N. ; Haond, M. ; et. al. Assessment of 28nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements. In: Solid-State Electronics, Vol. 117, p. 130-137 (11/12/2015)
Permanent URL http://hdl.handle.net/2078.1/169663