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Depth-explicit SOC assessments at high vertical resolution using closed-tube sampling and VIS-NIR spectroscopy

Bibliographic reference Doetterl, Sebastian ; Stevens, Antoine ; Van Oost, Kristof ; van Wesemael, Bas. Depth-explicit SOC assessments at high vertical resolution using closed-tube sampling and VIS-NIR spectroscopy.EGU General Assembly Conference 2013 (Vienna, Austria, du 07/04/2013 au 12/04/2013). In: Geophysical Research Abstracts, Vol. 15, p. 2795 (2013)
Permanent URL http://hdl.handle.net/2078.1/155924