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Chemistry and sputtering induced by fullerene and argon clusters in carbon-based materials

Bibliographic reference Czerwinski, Bartlomiej ; Delcorte, Arnaud. Chemistry and sputtering induced by fullerene and argon clusters in carbon-based materials. In: Surface and Interface Analysis, Vol. 46, no.S1, p. 11-14 (2014)
Permanent URL http://hdl.handle.net/2078.1/155886
  1. Sostarecz A.G., Sun S., Szakal C., Wucher A., Winograd N., Depth profiling studies of multilayer films with a C60+ ion source, 10.1016/j.apsusc.2004.03.111
  2. Winograd Nicholas, The Magic of Cluster SIMS, 10.1021/ac053355f
  3. Mahoney, Mass Spectrom. Rev., 29, 247 (2010)
  4. Fletcher John S., Vickerman John C., Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions, 10.1021/ac303088m
  5. Mouhib T., Poleunis C., Möllers R., Niehuis E., Defrance P., Bertrand P., Delcorte A., Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters : Organic depth profiling C60/phthalocyanine using Ar clusters, 10.1002/sia.5052
  6. Basiuk Vladimir A., Alvarez-Zauco Edgar, Basiuk Elena V., Chemical Crosslinking in C60 Thin Films, Micromanufacturing and Nanotechnology ISBN:3540253777 p.453-462, 10.1007/3-540-29339-6_20
  7. Garrison, TOF-SIMS: Surface Analysis by Mass Spectrometry, 223 (2001)
  8. Garrison Barbara J., Postawa Zbigniew, Computational view of surface based organic mass spectrometry, 10.1002/mas.20165
  9. Czerwinski Bartlomiej, Postawa Zbigniew, Garrison Barbara J., Delcorte Arnaud, Molecular dynamics study of polystyrene bond-breaking and crosslinking under C60 and Arn cluster bombardment, 10.1016/j.nimb.2012.11.030
  10. Czerwinski Bartlomiej, Delcorte Arnaud, Molecular Dynamics Study of Fullerite Cross-Linking under keV C60and ArnCluster Bombardment, 10.1021/jp310635g
  11. Stuart Steven J., Tutein Alan B., Harrison Judith A., A reactive potential for hydrocarbons with intermolecular interactions, 10.1063/1.481208