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Fundamental aspects of Arn+SIMS profiling of common organic semiconductors

Bibliographic reference Fleischmann, C. ; Conard, T. ; Havelund, R. ; Franquet, A. ; Poleunis, Claude ; et. al. Fundamental aspects of Arn+SIMS profiling of common organic semiconductors. In: Surface and Interface Analysis, Vol. 46, no.S1, p. 54-57 (2014)
Permanent URL http://hdl.handle.net/2078.1/155880
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