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First-principles study of second-order Resonance Raman scattering of silicon

Bibliographic reference Gillet, Yannick ; Giantomassi, Matteo ; Gonze, Xavier ; Kontur, Stefan ; Draxl, Claudia. First-principles study of second-order Resonance Raman scattering of silicon.Electron-phonon Meeting (Rome, du 14/01/2015 au 16/01/2015).
Permanent URL http://hdl.handle.net/2078.1/155838