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Experimental Analysis of Flip-Flops Minimum Operating Voltage in 28nm FDSOI and the Impact of Back Bias and temperature

Bibliographic reference Bernard, Sébastien ; Belleville, Bernard ; Valentian, Alexandre ; Legat, Jean-Didier ; Bol, David. Experimental Analysis of Flip-Flops Minimum Operating Voltage in 28nm FDSOI and the Impact of Back Bias and temperature.International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS 2014) (Palma de Mallorca (Spain), du 29/09/2014 au 01/10/2014).
Permanent URL http://hdl.handle.net/2078.1/152750