User menu

Impact of Back Gate Biasing Schemes on Energy and Robustness of ULV Logic in 28nm UTBB FDSOI Technology

Bibliographic reference de Streel, Guerric ; Bol, David. Impact of Back Gate Biasing Schemes on Energy and Robustness of ULV Logic in 28nm UTBB FDSOI Technology.2013 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED 2013) (Beijing (P.R.China), du 04/09/2013 au 06/09/2013).
Permanent URL http://hdl.handle.net/2078.1/152743