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A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks

Bibliographic reference Barenghi, Alessandro ; Hocquet, Cédric ; Bol, David ; Standaert, François-Xavier ; Regazzoni, Francesco ; et. al. A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks. In: IEEE Transactions on Emerging Topics in Computing, Vol. 2, no. 2, p. 107-118 (2014)
Permanent URL http://hdl.handle.net/2078.1/152586