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Total Ionizing Dose Effects on the Digital performance of Irradiated OCTO and Conventional Fully Depleted SOI MOSFET

Bibliographic reference de Souza Fino, Leonardo Navarenho ; Aparecida Guazzelli da Silveira, Marcilei ; Renaux, Christian ; Flandre, Denis ; Pinillos Gimenez, Salvador. Total Ionizing Dose Effects on the Digital performance of Irradiated OCTO and Conventional Fully Depleted SOI MOSFET.14th European Conference on radiation and its Effects on Components and Systems (RADECS 2013) (Oxford (UK), du 23/09/2013 au 27/09/2013).
Permanent URL http://hdl.handle.net/2078.1/152090