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Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime

Bibliographic reference Makovejev, Sergej ; Kazemi Esfeh, Babak ; Andrieu, François ; Raskin, Jean-Pierre ; Flandre, Denis ; et. al. Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime. In: Journal of Low Power Electronics and Applications, Vol. 4, no. 3, p. 201-213 (06/07/2014)
Permanent URL http://hdl.handle.net/2078.1/152031
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