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Technological and Material Challenges for High-Aspect Ratio and Teradot/Inch² Areal Density Structuring of Polyaniline Using Electron Beam Lithography.

Bibliographic reference Melinte, Sorin. Technological and Material Challenges for High-Aspect Ratio and Teradot/Inch² Areal Density Structuring of Polyaniline Using Electron Beam Lithography..SPIE Scanning Microscopy Conference (Monterey, CA (USA), du 17/05/2010 au 19/05/2010).
Permanent URL http://hdl.handle.net/2078.1/145373