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Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM

Bibliographic reference Ghazzal, Mohamed ; Wojcieszak, Robert ; Raj, Gijo ; Gaigneaux, Eric M.. Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM. In: Beilstein Journal of Nanotechnology, Vol. 5, p. 68-76 (2014)
Permanent URL http://hdl.handle.net/2078.1/144316