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Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications

Bibliographic reference Makovejev, Sergej ; Kazemi Esfeh, Babak ; Barral, V. ; Planes, N. ; Haond, M. ; et. al. Wide Frequency Band Assessment of 28 nm FDSOI Technology Platform for Analogue and RF Applications.15th International Conference on Ultimate Integration on Silicon (ULIS 2014) (Stockholm (Sweden), du 07/04/2014 au 09/04/2014). In: Proceedings of the 15th International Conference on ULTIMATE INTEGRATION ON SILICON (ULIS 2014), 2014, p. 2
Permanent URL http://hdl.handle.net/2078.1/144282