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Low Frequency Noise Measurements at Elevated Temperatures on Thin-Film SOI n-MOSFET

Bibliographic reference Dessard, Vincent ; Flandre, Denis. Low Frequency Noise Measurements at Elevated Temperatures on Thin-Film SOI n-MOSFET.28th European Solid-State Device Research Conference (Bordeaux (France), du 08/09/1998 au 10/09/1998).
Permanent URL http://hdl.handle.net/2078.1/141641