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Threshold Voltage Extraction Techniques and Temperature Effect in Context of Global Variability in UTBB MOSFETs

Bibliographic reference Makovejev, Sergej ; Kazemi Esfeh, Babak ; Andrieu, François ; Raskin, Jean-Pierre ; Flandre, Denis ; et. al. Threshold Voltage Extraction Techniques and Temperature Effect in Context of Global Variability in UTBB MOSFETs.43rd European Solid-State Device Research Conference (ESSDERC 2013) (Bucharest (Roumania), du 16/09/2013 au 20/09/2013). In: Proceedings of the 43rd European Solid-State Device Research Conference (ESSDERC 2013), 2013, p.4
Permanent URL http://hdl.handle.net/2078.1/140997