User menu

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

Bibliographic reference Mouhib, T. ; Poleunis, Claude ; Wehbe, N. ; Michels, J. J. ; Galagan, Y. ; et. al. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. In: The Analyst, Vol. 138, no.22, p. 6801-6810 (2013)
Permanent URL
  1. Yu G., Gao J., Hummelen J. C., Wudl F., Heeger A. J., Polymer Photovoltaic Cells: Enhanced Efficiencies via a Network of Internal Donor-Acceptor Heterojunctions, 10.1126/science.270.5243.1789
  2. Halls J. J. M., Walsh C. A., Greenham N. C., Marseglia E. A., Friend R. H., Moratti S. C., Holmes A. B., Efficient photodiodes from interpenetrating polymer networks, 10.1038/376498a0
  3. Tang C. W., Two‐layer organic photovoltaic cell, 10.1063/1.96937
  4. Ma W., Yang C., Gong X., Lee K., Heeger A. J., Thermally Stable, Efficient Polymer Solar Cells with Nanoscale Control of the Interpenetrating Network Morphology, 10.1002/adfm.200500211
  5. Kim Youngkyoo, Cook Steffan, Tuladhar Sachetan M., Choulis Stelios A., Nelson Jenny, Durrant James R., Bradley Donal D. C., Giles Mark, McCulloch Iain, Ha Chang-Sik, Ree Moonhor, A strong regioregularity effect in self-organizing conjugated polymer films and high-efficiency polythiophene:fullerene solar cells, 10.1038/nmat1574
  6. Li Gang, Shrotriya Vishal, Huang Jinsong, Yao Yan, Moriarty Tom, Emery Keith, Yang Yang, High-efficiency solution processable polymer photovoltaic cells by self-organization of polymer blends, 10.1038/nmat1500
  7. Liao Hua-Hsien, Chen Li-Min, Xu Zheng, Li Gang, Yang Yang, Highly efficient inverted polymer solar cell by low temperature annealing of Cs2CO3 interlayer, 10.1063/1.2918983
  8. Ponjée M.W.G, Reijme M.A, Denier van der Gon A.W, Brongersma H.H, Langeveld-Voss B.M.W, Intermolecular segregation of siloxane in P3HT: surface quantification and molecular surface-structure, 10.1016/s0032-3861(01)00597-3
  9. Campoy-Quiles Mariano, Ferenczi Toby, Agostinelli Tiziano, Etchegoin Pablo G., Kim Youngkyoo, Anthopoulos Thomas D., Stavrinou Paul N., Bradley Donal D. C., Nelson Jenny, Morphology evolution via self-organization and lateral and vertical diffusion in polymer:fullerene solar cell blends, 10.1038/nmat2102
  10. Björström Cecilia M, Bernasik Andrzej, Rysz Jakub, Budkowski Andrzej, Nilsson Svante, Svensson Mattias, Andersson Mats R, Magnusson Kjell O, Moons Ellen, Multilayer formation in spin-coated thin films of low-bandgap polyfluorene:PCBM blends, 10.1088/0953-8984/17/50/l01
  11. Björström Cecilia M., Nilsson Svante, Bernasik Andrzej, Budkowski Andrzej, Andersson Mats, Magnusson Kjell O., Moons Ellen, Vertical phase separation in spin-coated films of a low bandgap polyfluorene/PCBM blend—Effects of specific substrate interaction, 10.1016/j.apsusc.2006.08.024
  12. Steuerman D. W., Garcia A., Dante M., Yang R., Löfvander J. P., Nguyen T.-Q., Imaging the Interfaces of Conjugated Polymer Optoelectronic Devices, 10.1002/adma.200700887
  13. Thummalakunta L.N.S.A., Yong Chian Haw, Ananthanarayanan Krishnamoorthy, Luther Joachim, P3HT based solution-processed pseudo bi-layer organic solar cell with enhanced performance, 10.1016/j.orgel.2012.05.054
  14. Chen Wen-Yin, Ling Yong-Chien, Chen Bo-Jung, Shih Hung-Hsin, Cheng Chien-Hong, Diffusion study of multi-organic layers in OLEDs by ToF-SIMS, 10.1016/j.apsusc.2006.02.228
  15. Geiser Alain, Fan Bin, Benmansour Hadjar, Castro Fernando, Heier Jakob, Keller Beat, Mayerhofer Karl Emanuel, Nüesch Frank, Hany Roland, Poly(3-hexylthiophene)/C60 heterojunction solar cells: Implication of morphology on performance and ambipolar charge collection, 10.1016/j.solmat.2007.11.001
  16. Carado Anthony, Passarelli M. K., Kozole Joseph, Wingate J. E., Winograd Nicholas, Loboda A. V., C60Secondary Ion Mass Spectrometry with a Hybrid-Quadrupole Orthogonal Time-of-Flight Mass Spectrometer, 10.1021/ac801712s
  17. Fletcher John S., Vickerman John C., A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems, 10.1007/s00216-009-2986-3
  18. Gillen Greg, Roberson Sonya, Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry, 10.1002/(sici)1097-0231(19981015)12:19<1303::aid-rcm330>;2-7
  19. Winograd Nicholas, The Magic of Cluster SIMS, 10.1021/ac053355f
  20. Mahoney, Mass Spectrom. Rev., 29, 247 (2010)
  21. Shard A. G., Brewer P. J., Green F. M., Gilmore I. S., Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials, 10.1002/sia.2525
  22. Mouhib T., Poleunis C., Möllers R., Niehuis E., Defrance P., Bertrand P., Delcorte A., Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters : Organic depth profiling C60/phthalocyanine using Ar clusters, 10.1002/sia.5052
  23. Houssiau L., Mine N., Molecular depth profiling of polymers with very low energy reactive ions, 10.1002/sia.3159
  24. Ninomiya Satoshi, Ichiki Kazuya, Yamada Hideaki, Nakata Yoshihiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro, Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams, 10.1002/rcm.4046
  25. Ninomiya Satoshi, Ichiki Kazuya, Yamada Hideaki, Nakata Yoshihiko, Seki Toshio, Aoki Takaaki, Matsuo Jiro, Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams, 10.1002/rcm.4250
  26. Niehuis E., Möllers R., Rading D., Cramer H.-G., Kersting R., Analysis of organic multilayers and 3D structures using Ar cluster ions : Analysis of organic multilayers using Ar cluster ions, 10.1002/sia.5079
  27. de Jong M. P., van IJzendoorn L. J., de Voigt M. J. A., Stability of the interface between indium-tin-oxide and poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) in polymer light-emitting diodes, 10.1063/1.1315344
  28. Madsen Morten V., Sylvester-Hvid Kristian O., Dastmalchi Babak, Hingerl Kurt, Norrman Kion, Tromholt Thomas, Manceau Matthieu, Angmo Dechan, Krebs Frederik C., Ellipsometry as a Nondestructive Depth Profiling Tool for Roll-to-Roll Manufactured Flexible Solar Cells, 10.1021/jp2004002
  29. Mouhib T., Delcorte A., Poleunis C., Bertrand P., C60 molecular depth profiling of bilayered polymer films using ToF-SIMS, 10.1002/sia.3539
  30. Wagner M. S., Impact Energy Dependence of SF5+-Induced Damage in Poly(methyl methacrylate) Studied Using Time-of-Flight Secondary Ion Mass Spectrometry, 10.1021/ac035330r
  31. Dowsett M.G., Barlow R.D., Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry, 10.1016/0003-2670(93)e0568-r
  32. Shard Alexander G., Havelund Rasmus, Seah Martin P., Spencer Steve J., Gilmore Ian S., Winograd Nicholas, Mao Dan, Miyayama Takuya, Niehuis Ewald, Rading Derk, Moellers Rudolf, Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study, 10.1021/ac301567t
  33. Lee J. L. S., Ninomiya S., Matsuo J., Gilmore I. S., Seah M. P., Shard A. G., Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions, 10.1021/ac901045q
  34. Rabbani Sadia, Barber Andrew M., Fletcher John S., Lockyer Nicholas P., Vickerman John C., TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+, 10.1021/ac200288v
  35. Wehbe N., Tabarrant T., Brison J., Mouhib T., Delcorte A., Bertrand P., Moellers R., Niehuis E., Houssiau L., TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+and Cs+sputtering ions: A comparative study : ToF-SIMS depth profiling of multilayer amino-acid films, 10.1002/sia.5121
  36. Czerwinski Bartlomiej, Delcorte Arnaud, Molecular Dynamics Study of Fullerite Cross-Linking under keV C60and ArnCluster Bombardment, 10.1021/jp310635g
  37. Czerwinski Bartlomiej, Rzeznik Lukasz, Paruch Robert, Garrison Barbara J., Postawa Zbigniew, Effect of impact angle and projectile size on sputtering efficiency of solid benzene investigated by molecular dynamics simulations, 10.1016/j.nimb.2010.12.026
  38. Restrepo Oscar A., Delcorte Arnaud, Argon Cluster Sputtering of a Hybrid Metal–Organic Surface: A Microscopic View, 10.1021/jp3110503
  39. Webb Roger P., Garrison Barbara J., Vickerman John C., The effect of the H:C ratio on the sputtering of molecular solids by fullerenes, 10.1002/sia.3421
  40. Delcorte A, Bertrand P, Arys X, Jonas A, Wischerhoff E, Mayer B, Laschewsky A, ToF-SIMS study of alternate polyelectrolyte thin films: Chemical surface characterization and molecular secondary ions sampling depth, 10.1016/0039-6028(96)00779-0
  41. Philipp Patrick, Ngo Quyen K., Shtein Max, Kieffer John, Wirtz Tom, Ag-Organic Layered Samples for Optoelectronic Applications: Interface Width and Roughening Using a 500 eV Cs+Probe in Dynamic Secondary Ion Mass Spectrometry, 10.1021/ac302939m
  42. Delcorte A., Leblanc Ch., Poleunis C., Hamraoui K., Computer Simulations of the Sputtering of Metallic, Organic, and Metal–Organic Surfaces with Binand C60Projectiles, 10.1021/jp308411r