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Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

Bibliographic reference Mouhib, T. ; Poleunis, Claude ; Wehbe, N. ; Michels, J. J. ; Galagan, Y. ; et. al. Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams. In: The Analyst, Vol. 138, no.22, p. 6801-6810 (2013)
Permanent URL http://hdl.handle.net/2078.1/139512
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