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Scanning Gate Microscopy images the electronic LDOS inside nanostructures

Bibliographic reference Huant, S. ; Rodrigues Martins, Frederico ; Pala, M. G. ; Hackens, Benoît ; Ouisse, T. ; et. al. Scanning Gate Microscopy images the electronic LDOS inside nanostructures.11th Int. Conf. Non-Contact Atomic Force Microscopy (Madrid, Spain).
Permanent URL http://hdl.handle.net/2078.1/136172