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Dependence of the electronic transport on the microstructure in annealed Bi thin films.

Bibliographic reference Faniel, Sébastien ; Rodrigues Martins, Frederico ; Bayot, Vincent ; Hackens, Benoît ; Desplanque, L. ; et. al. Dependence of the electronic transport on the microstructure in annealed Bi thin films..APS March Meeting (Baltimore (USA), du 18/03/2013 au 22/03/2013).
Permanent URL http://hdl.handle.net/2078.1/135515