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Scattering gate interferometry at a quantum point contact” 20th International Conference on Electronic Properties of Two-Dimensional Systems

Bibliographic reference Brun, B. ; Rodrigues Martins, Frederico ; Faniel, Sébastien ; Hackens, Benoît ; Bayot, Vincent ; et. al. Scattering gate interferometry at a quantum point contact” 20th International Conference on Electronic Properties of Two-Dimensional Systems.20th International Conference on Electronic Properties of Two-Dimensional Systems (EP2DS-20) (Wroclaw, Poland).
Permanent URL http://hdl.handle.net/2078.1/135513