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Nonlinear analysis of Electrostatic Force Microscopy

Bibliographic reference Dianoux, R. ; Rodrigues Martins, Frederico ; Alandi, C. ; Marchi, F. ; Chevrier, J. ; et. al. Nonlinear analysis of Electrostatic Force Microscopy.12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (Eindhoven, Netherlands, du 21/07/2003 au 25/07/2003).
Permanent URL http://hdl.handle.net/2078.1/135507