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Theory of electric force microscopy in the parametric amplification regime

Bibliographic reference Ouisse, T. ; Stark, M. ; Rodrigues Martins, Frederico ; Bercu, B. ; Huant, S. ; et. al. Theory of electric force microscopy in the parametric amplification regime. In: Physical review. B, Condensed matter and materials physics, Vol. 71, p. 205404 (2005)
Permanent URL http://hdl.handle.net/2078.1/135505
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