User menu

Total-dose effects in double-gate-controlled NPN bipolar transistors

Bibliographic reference Vandooren, Anne ; Yuan, Jang-Gn ; Flandre, Denis ; Colinge, Jean-Pierre. Total-dose effects in double-gate-controlled NPN bipolar transistors. In: IEEE Transactions on Nuclear Science, Vol. 48, no.5, p. 1694-1699 (2011)
Permanent URL http://hdl.handle.net/2078.1/134310