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A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs

Bibliographic reference Rudenko, Tamara ; Lysenko, V.S. ; Kilchytska, Valeriya ; Rudenko, A.N.. A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs. In: F.Balestra, A.N.Nazarov, V.S.Lysenko, Perspectives, Science and Technologies for Novel Silicon on Insulator Devices, Kluwer  : The Netherlands 2000, p.281-293
Permanent URL http://hdl.handle.net/2078.1/132865