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Charge carrier injection and trapping in the buried oxides of SOI structures

Bibliographic reference Nazarov, Alexei ; Kilchytska, Valeriya ; Barchuk, I.P.. Charge carrier injection and trapping in the buried oxides of SOI structures. In: F.Balestra, A.N.Nazarov, V.S.Lysenko, Perspectives, Science and Technologies for Novel Silicon on Insulator Devices, Kluwer Academic Publishers  : The Netherlands 2002, p. 139-158
Permanent URL http://hdl.handle.net/2078.1/132864