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Modeling and measurements of high-temperature off-state currents in SOI MOSFETs

Bibliographic reference Rudenko, Tamara ; Rudenko, A. ; Kilchytska, Valeriya. Modeling and measurements of high-temperature off-state currents in SOI MOSFETs.8th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices" (Paris (France), du 31/08/1997 au 05/09/1997). In: Proceedings of the 8th International Electrochemical Society meeting and Symposium on "Silicon-on-Insulator Technology and Devices", S.Cristoloveanu1997, p.295-300
Permanent URL http://hdl.handle.net/2078.1/132843