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Bias-temperature phenomena in SOI structures and devices

Bibliographic reference Nazarov, A.N. ; Barchuk, I.P. ; Kilchytska, Valeriya. Bias-temperature phenomena in SOI structures and devices.NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" (Kiev (Ukraine), du 12/10/1998 au 15/10/1998). In: Proceedings of the NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices", 1998
Permanent URL http://hdl.handle.net/2078.1/132842