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A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs

Bibliographic reference Rudenko, Tamara ; Lysenko, V.S ; Kilchytska, Valeriya ; Rudenko, A.N.. A comprehensive analysis of the high-temperature off-state and subthreshold characteristics of SOI MOSFETs.NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" (Kiev (Ukraine), du 12/10/1998 au 15/10/1998). In: Proceedings of the NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices", 1998
Permanent URL http://hdl.handle.net/2078.1/132829