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Properties of high-temperature off-state currents in SOI MOSFETs derived from the diffusion mechanism

Bibliographic reference Rudenko, Tamara ; Lysenko, V. ; Kilchytska, Valeriya ; Rudenko, A. ; Colinge, Jean-Pierre. Properties of high-temperature off-state currents in SOI MOSFETs derived from the diffusion mechanism.Third European Conference on High Temperature Electronics (HITEN 1999) (Berlin (Germany), du 04/07/1999 au 07/07/1999). In: Proceedings of the Third European Conference on High Temperature Electronics (HITEN 1999), IEEE1999, p. 83-86
Permanent URL http://hdl.handle.net/2078.1/132827