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Charge carrier injection and trapping in the buried oxides of SOI structures

Bibliographic reference Nazarov, Alexei ; Kilchytska, Valeriya ; Barchuk, I.P.. Charge carrier injection and trapping in the buried oxides of SOI structures.NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices" (Kiev (Ukraine), du 15/10/2000 au 20/10/2000). In: Proceedings of the NATO Advanced Research Workshop on "Perspectives, Science and Technologies for Novel Silicon on Insulator Devices", 2000
Permanent URL http://hdl.handle.net/2078.1/132825