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In-situ monitoring of thermally induced resistivity changes in silver thin films

Bibliographic reference De Maeyer, Barbara ; Van Wonterghem, Frédéric ; Proost, Joris. In-situ monitoring of thermally induced resistivity changes in silver thin films.142nd Annual Meeting of the Metallurgical Society (TMS), Symposium on Fatigue and Fracture of Thin Films and Nanomaterials (San Antonio, USA, du 03/03/2013 au 07/03/2013). In: Proceedings of the 142nd Annual Meeting of the Metallurgical Society (TMS), 2013, p.263
Permanent URL http://hdl.handle.net/2078.1/131944