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Stress relaxation in Al-Cu and Al-Si-Cu thin films

Bibliographic reference Witvrouw, A. ; Proost, Joris ; Roussel, Ph. ; Cosemans, P. ; Maex, K.. Stress relaxation in Al-Cu and Al-Si-Cu thin films. In: Journal of Materials Research, Vol. 14, no.4, p. 1246-1254 (1999)
Permanent URL http://hdl.handle.net/2078.1/131930
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