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In-situ monitoring of thermally induced resistivity changes in silver thin films

Bibliographic reference De Maeyer, Barbara ; Van Wonterghem, Frédéric ; Proost, Joris. In-situ monitoring of thermally induced resistivity changes in silver thin films. In: Journal of Electronic Materials, Vol. 43, no. 2, p. 548-554 (February 2014)
Permanent URL http://hdl.handle.net/2078.1/131924
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