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Study of the positive charge buildup into buried oxide of SIMOX SOI structure during bias-temperature stress

Bibliographic reference Barchuk, I. ; Kilchytska, Valeriya ; Nazarov, Alexei. Study of the positive charge buildup into buried oxide of SIMOX SOI structure during bias-temperature stress. In: Microelectronics Reliability, Vol. 40, p. 811-814 (2000)
Permanent URL http://hdl.handle.net/2078.1/131434