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New Evidence of Interfacial Oxide Traps in n-Type 4H- and 6H-SiC MOS Structures

Bibliographic reference Ólafsson, Halldor Örn ; Sveinbjörnsson, Einar ; Rudenko, Tamara ; Kilchytska, Valeriya ; Tyagulski, I.P. ; et. al. New Evidence of Interfacial Oxide Traps in n-Type 4H- and 6H-SiC MOS Structures. In: Materials Science Forum, Vol. 389-393, p. 1001-1004 (2002)
Permanent URL http://hdl.handle.net/2078.1/131432