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A Study of the Shallow Electron Traps at the 4H-SiC/SiO2 Interface

Bibliographic reference Ólafsson, Halldór Örn ; Sveinbjörnsson, Einar ; Rudenko, Tamara ; Kilchytska, Valeriya ; Tyagulski, I.P. ; et. al. A Study of the Shallow Electron Traps at the 4H-SiC/SiO2 Interface. In: Materials Science Forum, Vol. 433-436, p. 547-550 (2003)
Permanent URL http://hdl.handle.net/2078.1/131430