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High-field current transport and charge trapping in buried oxide of SOI materials under high-field electron injection

Bibliographic reference Nazarov, Alexei ; Kilchytska, Valeriya ; Houk, Youri. High-field current transport and charge trapping in buried oxide of SOI materials under high-field electron injection. In: Journal of Telecommunications and Information Technology, Vol. 94, no. 1, p. 12 (2004)
Permanent URL http://hdl.handle.net/2078.1/131426