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Wideband Characterization of SOI Materials and Devices

Bibliographic reference Raskin, Jean-Pierre ; Lederer, Dimitri ; Kilchytska, Valeriya. Wideband Characterization of SOI Materials and Devices. In: Sergo B.Kobadze, Solid State Electronics Research, Nova Publishers  2009, p. 391
Permanent URL http://hdl.handle.net/2078.1/130551