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Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs

Bibliographic reference Kilchytska, Valeriya ; Alvarado Pulido, José Joaquin ; Collaert, N. ; Rooyakers, R. ; Put, S. ; et. al. Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs.Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2010) (Grenoble (France), du 25/01/2010 au 27/01/2010). In: Proceedings of the Sixth Workshop of the Thematic Network on Silicon on Insulator technology, devices and circuits (EUROSOI 2010), 2010, p. 119-120
Permanent URL http://hdl.handle.net/2078.1/130530