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Core-level shifts in Si(001)-SiO2 systems: The value of first-principle investigations

Bibliographic reference Pasquarello, A. ; Hybertsen, M.S. ; Rignanese, Gian-Marco ; Car, R.. Core-level shifts in Si(001)-SiO2 systems: The value of first-principle investigations. In: E. Garfunkel, E. Gusev and A. Vul, Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices, Kluwer  : Dordrecht 1998, p. pp 89-102
Permanent URL http://hdl.handle.net/2078.1/130285