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Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits

Bibliographic reference Alvarado Pulido, José Joaquin ; Kilchytska, Valeriya ; Boufouss, El Hafed ; Flandre, Denis. Modeling of Single Event Transients and Total Dose in Partially Depleted SOI CMOS Circuits.EUROSOI 2010 (Grenoble (France), du 25/01/2010 au 27/01/2010). In: Proceedings of EUROSOI 2010, 2010
Permanent URL http://hdl.handle.net/2078.1/129899