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Characterization and modeling of single event transients in LDMOS-SOI FETs

Bibliographic reference Alvarado Pulido, José Joaquin ; Kilchytska, Valeriya ; Boufouss, El Hafed ; Flandre, Denis. Characterization and modeling of single event transients in LDMOS-SOI FETs.22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (Bordeaux, du 03/06/2013 au 07/06/2013). In: Proceedings of the 22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2011, 2011
Permanent URL http://hdl.handle.net/2078.1/129897