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Experimental Validation of the Drain Current Analytical Model of the Fully Depleted Diamond SOI nMOSFETs by Using Paired T-test Statistical Evaluation

Bibliographic reference Peruzzi, V.V. ; Renaux, Christian ; Flandre, Denis ; Gimenez, S.P.. Experimental Validation of the Drain Current Analytical Model of the Fully Depleted Diamond SOI nMOSFETs by Using Paired T-test Statistical Evaluation. In: ECS Transactions, Vol. 49, no.1, p. 169-176 (2012)
Permanent URL http://hdl.handle.net/2078.1/129573