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Fabrication, electrical characterization and scanning gate microscopy of Schottky silicon nanowire devices

Bibliographic reference Melinte, Sorin ; Iordanescu, Andra-Gabriela ; Dutu, Constantin Augustin ; Flandre, Denis ; Faniel, Sébastien ; et. al. Fabrication, electrical characterization and scanning gate microscopy of Schottky silicon nanowire devices.APS March Meeting (Baltimore (USA), du 18/03/2013 au 22/03/2013). In: Bulletin of the American Physical Society, 2013, p.1
Permanent URL http://hdl.handle.net/2078.1/128610