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In situ monitoring of electrostriction in anodic and thermal silicon dioxide thin films

Bibliographic reference Blaffart, Frédéric ; Van Overmeere, Quentin ; Pardoen, Thomas ; Proost, Joris. In situ monitoring of electrostriction in anodic and thermal silicon dioxide thin films. In: Journal of Solid State Electrochemistry : current research and development in science and technology, Vol. 17, p. 1945-1954 (February 2013)
Permanent URL http://hdl.handle.net/2078.1/127302
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