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Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters

Bibliographic reference Mouhib, Taoufiq ; Poleunis, Claude ; Möllers, R. ; Niehuis, E. ; Defrance, Pierre ; et. al. Organic depth profiling of C60 and C60/phthalocyanine layers using argon clusters. In: Surface and Interface Analysis, Vol. 45, no.1, p. 163-166 (2013)
Permanent URL http://hdl.handle.net/2078.1/125257
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