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TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn

Bibliographic reference Wehbe, N. ; Tabarrant, T. ; Brison, J. ; Mouhib, Taoufiq ; Delcorte, Arnaud ; et. al. TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn. In: Surface and Interface Analysis, Vol. 45, no. 1, p. 178-180 (2013)
Permanent URL http://hdl.handle.net/2078.1/125255
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  4. Lee J. L. S., Ninomiya S., Matsuo J., Gilmore I. S., Seah M. P., Shard A. G., Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions, 10.1021/ac901045q